光基因新角色-cop8
COP8 is the second unit of COP9 signalsome. In the comparison of BLAST ,we found that\r LLPC14 cDNA and the protein sequence are quit similar to the COP8 of Arabidopsis thaliana\r Therefore, we are interested in the role that COP8 plays in the photomorphogenesis and try to find\r the length of the sequence. So far, no result is obtained about the 3’-RACE, but we’re surprised to\r find that the sequence found in 5’-RACE is shorter than what we’re know, which suggests the RNA\r length of the cDNA used in the RACE combination has decreased.\r Although the final results of the COP8 5’and 3’-RACE haven’t been achieved, it is sure the\r COP8 is highly-conserved in many species. Since the similarity between LLPC14 and the COP8 of\r Arabidopsis thaliana is as high as 90 percent, we used the COP8 of Arabidopsis thaliana to detect the\r COP8 protein in pollen.在過去種綠豆芽的經驗中,不難發現它本身因為環境的不同,而有不同型態白化\r 的現象,例如:黑暗下萌發的豆苗。但尚未深入去理解白化的原因;而在後來的種植\r 經驗上,也發現有許多令自己覺得困惑的相同處。\r 在高二的生命科學第四章中,有提到光照與黑暗生長的植株,在構造比較上有明\r 顯的不同;其中,提及植物的活性組織存在「光敏素」(phytochrome),此色素蛋白的\r 存在於光照後,會引發一連串反應,至此,也稍微了解植物的萌發反應的差別。\r 故藉由個人在中研院植物所的資優生培訓過程,便以此為前題,進一步探究植物基\r 因組COP 8 與白化現象的相關性
曲率的奧秘
我們研究的主題是曲率,且以高中所學的函數為主。雖然大學已有曲率公式,但我們將其表示成高中生較易了解的型式,並且以f(x) 的方式呈現。我們在函數曲線上取不共線三點,構成一個三角形,並求出此三角形的外接圓半徑。再將所取三點逼近,所求之半徑即為特定點的密切圓,也就是曲率半徑。而此曲率半徑的倒數,就是所求的曲率,同時我們將公式帶入高中各常見函數,以導出函數上各點曲率。;Our study is about curvature, especially about the fuctions we learn in senior high school. In university, there is a certain formula for curvature, but we hope to change it into a form that can be easily accepted by senior high school students, and express the formula with f(x), the symbol of functions. We pick three incollinear points from the curve of a function, making the three points into a triangle, and figure out the circumradius of this triangle. Then, we approximate the three points to one of them, and the circumradius will also be the radius of the osculating circle of the point. We define the radius as radius of curvature. The reciprocal of the radius of curvature will be the curvature. Then, we use the formula to figure out the curvature of the functions we learn in senior high school.
環狀網路的拓樸性質研究
In any , we prove that there exist cycles which have any length between 3 and 3n and paths which have any length between their smallest distance and longest Hamiltonian paths in any two different nodes; for any two nodes, there exist varied Hamiltonian cycles, making the two nodes locate on any possible counterpart position(only limited by the distance between the two nodes). In , there are 2n internally-disjoint spanning cycles, and 2n-1 internally-disjoint spanning paths. Besides, we also prove has no more than 2n disjoint spanning paths, and calculate its wide diameter.
本報告證明在環狀網路 中,存在有長度3到 3n 的所有迴圈;任何相異兩點都有各種不同的長度的路徑:從最短的距離到最長的漢米頓路徑;取定任意兩點,存在有各種不同的漢米爾頓迴圈,使得兩點位於所有可能的相對位置上(僅被兩點之間的距離限制)。在 中,也具有2n 個彼此不相交、經過所有點的迴圈,以及2n-1 個彼此不相交、經過所有點的路徑。除此之外,也證明了,在兩相異點間,具有個數不超過2n 且互斥的路徑,且這些路徑經過所有點。我們也估算了它的寬直徑。
懸浮奈米污染物之感測方法(Sensing of Nanopollutants with an Ionic Liquid)
由於奈米科技之進步發展神速,許多難以偵測的奈米污染物可能對生物體造成不可預知的負面影響,然而傳統之感測方法主要針對氣體分子,可能不適用於感測粒狀奈米污染物質。因此,本研究之主要目的是探討(也建立一套)奈米污染物簡易感測方法之可行性。利用二至三個塑膠瓶、塑膠管組裝簡易感測實驗,並且使用非常少量(約0.05 mL)之綠色溶劑(離子熔液),實驗結果顯示奈米ZnO 及螢光粉塵灰(2 或奈米CuO 反而使電阻增加;未通過過濾材料之螢光粉塵灰(2 and phosphor particulates was conducted in a home-made nanopollutant sensing system. Experimentally, abstraction of nano ZnO into the IL caused a reduction of the IL resistance. Similarly, decreasing of the IL resistance was also observed in the abstraction of phosphor particles with particles sizes of 2 particles was found. Abstraction of nano CuO in the IL also led to a slight increase of the IL resistance. The determined characteristic resistances of the IL for abstraction of select nano particles such as nano ZnO, nano CuO, nano TiO2 and phosphor particulates may be used in the development of novel nanopollutants sensors.
不偏不倚--奈米級修準方法與敏感度評估之研究
Positive –A Study on a Nanoscale Revision Method and Sensitivity Evaluation This paper took a pyramid and a fixed point as the reference level. It was the intention of our team to establish and prove a new hardness value revising method that is to be used in the deflection of indentation of nano indentor. Such new method was named Material Surface Nanoscale Hardness Revision Method with which we re-measured various materials and error sensitivity of hardness values. We obtained the following conclusions:(1). This paper revision modification method have a highly precision. (2). When the round tip or plane tip was closed to ideal indentor tip, the contact areas during indentation process were close, not demonstrating significant difference. (3). The indentation triangle created when loading effort P was similar with the one left on the sample material when unloading the effort; thus, even though the sink-in and pile up effects due to the mechanical properties of sample material caused the differentiation of side lengths and two indentation areas, the angles of two indentation areas was the same. (4). When the effort was loaded by the tip onto the sample material, if the tip had a certain deflection ψ or rotation ω, the indentation triangle left on the sample material was still significant. (5). In the observation of the indentation triangle left on the sample material, when the triangle cannot become a regular triangle, it meant that there is a deflection or rotation happening to the tip and a further revision of the deflected angle ψ or rotated angle ω is required. (6). The hardness value revision method under indentation deflection situation had the best effect on the projected area revision; the second was on the indentation volume revision and than on the indentation contact area revision. (7). The hardness error sensitivity of hardness value revision method under indentation deflection situation had the best effect on the projected area; the second was on the contact area and than on the indentation volume revision. (8). The method proposed by this study was proved by the silica and aluminum single crystal indentation results and is thus able to be applied to the engineering in the nanoscale measurement of metal materials to obtain more precise data.不偏不倚-奈米級修準方法與敏感度評估之研究在這篇研究報告中,以一個三角錐和一個定點為基準,本團隊建立並證明一個新的在奈米硬度測試儀壓痕偏斜情況下,硬度值的修正方法,取名材料表面奈米硬度修正方法。在新的材料表面奈米硬度修正方法下,重新檢測各種材料及硬度誤差敏感度,得到許多好的結論:(1)本研究之修準方法具有高度精確性。(2)利用圓球尖端或平面尖端的方法近似理想壓頭時其壓痕過程中之接 觸面積相近,並無明顯差異。(3)作用力P 施加(Loading)時之壓痕三角形與卸載時(unloading)殘留於測試材料上之壓痕三角形係屬於相似形;因此,即使各該三角形之邊長因為該測試材料本身的機械性質所產生的滲入(sink-in)與堆放(pile-up)的效應而造成作用力施加與卸載時,壓痕面積上的差異。不過,該兩壓痕面積的角度卻是一致的。(4)當該作用力隨著該壓頭施加於測試材料時,若該壓頭產生某一程度的偏斜ψ 或旋轉ω 時,該殘留於測試材料上之壓痕三角形仍然具有代表性。(5)藉由觀察該殘留於測試材料上之壓痕三角形,當該三角形無法成為一正三角形時,其係表示壓頭已產生偏斜或旋轉的之情況,需要進一步對該偏斜角度ψ 或旋轉角度ω 進行修正。(6)在壓痕偏斜情況下硬度值的修正方法以投影面積修正為最佳,其次是壓痕體積再其次是壓痕接觸面積方法作修正。(7)在壓痕偏斜情況下硬度值修正方法的硬度誤差敏感度則以投影面積為最佳,其次是接觸面積再其次是壓痕體積修正方法。(8)本研究提出之修正方法經由矽、鋁單晶壓痕結果驗證,足以說明適用於工程學上金屬材料進行奈米壓痕硬度檢測時更精確的數據獲得。